IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design methodology of a robust ESD protection circuit for STI process 256 Mb NAND flash memory

Author(s): T. Ikehashi ; K. Imamiya ; K. Sakui
Sponsor(s): IEEE Components, Packaging, and Manufacturing Technology Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2000
Volume: 23
Page Count: 1
Page(s): 235
ISSN (Paper): 1521-334X
ISSN (Online): 1558-0822
DOI: 10.1109/TEPM.2000.895053
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