IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nondestructive defect detection in multilayer ceramic capacitors using an improved digital speckle correlation method with wavelet packet noise reduction processing

Author(s): Y.C. Chan ; K.C. Hung ; X. Dai
Sponsor(s): IEEE Components, Packaging, and Manufacturing Technology Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2000
Volume: 23
Page Count: 8
Page(s): 80 - 87
ISSN (Paper): 1521-3323
ISSN (Online): 1557-9980
DOI: 10.1109/6040.826765
Regular:

The nondestructive detection of defects in multilayer ceramic capacitors (MLCs) in-surface mount printed circuit board assemblies has been demonstrated by using an improved digital speckle... View More

Advertisement