IEEE - Institute of Electrical and Electronics Engineers, Inc. - Architecture drives test system standards

Author(s): J. Mueller ; R. Oblad
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2000
Volume: 37
Page Count: 6
Page(s): 68 - 73
ISSN (Paper): 0018-9235
DOI: 10.1109/6.866287
Regular:

To automate test and measurement systems in R&D and manufacturing settings, it is common practice to connect the instruments to computers. With modern programming languages and a simple setup, the... View More

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