IEEE - Institute of Electrical and Electronics Engineers, Inc. - Contingency screening for steady-state security analysis by using FFT and artificial neural networks

Author(s): T.S. Sidhu ; Lan Cui
Sponsor(s): IEEE Power Engineering Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2000
Volume: 15
Page(s): 421 - 426
ISSN (Electronic): 1558-0679
ISSN (Paper): 0885-8950
DOI: 10.1109/59.852154
Regular:

A new approach based on artificial neural networks (ANNs) combined with fast Fourier transform (FFT) is developed for single line contingency screening in steady-state security analysis. The... View More

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