IEEE - Institute of Electrical and Electronics Engineers, Inc. - MOSFET 1/f noise measurement under switched bias conditions

Author(s): A.P. van der Wel ; E.A.M. Klumperink ; S.L.J. Gierkink ; R.F. Wassenaar ; H. Wallinga
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Volume: 21
Page Count: 4
Page(s): 43 - 46
ISSN (Paper): 0741-3106
ISSN (Online): 1558-0563
DOI: 10.1109/55.817447
Regular:

A new measurement setup is presented that allows the observation of 1/f noise spectra in MOSFET's under switched bias conditions in a wide frequency band (10 Hz-100 kHz). When switching between... View More

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