IEEE - Institute of Electrical and Electronics Engineers, Inc. - Full-wave analysis of 3D metallization structures using a spectral domain technique

Author(s): Becks, T. ; Wolff, I.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Albuquerque, NM, USA, USA
Conference Date: 1 June 1992
ISBN (Paper): 0-7803-0611-2
ISSN (Paper): 0149-645X
DOI: 10.1109/MWSYM.1992.188191
Regular:

A full-wave method for the investigation of microstrip- and coplanar-structures including 3-D metallization structures is presented. The spectral domain analysis method was used to calculate the... View More

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