IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental evaluation of large-signal modeling assumptions based on vector analysis of bias-dependent S-parameter data from MESFETs and HEMTs

Author(s): Root, D.E. ; Fan, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Albuquerque, NM, USA, USA
Conference Date: 1 June 1992
ISBN (Paper): 0-7803-0611-2
ISSN (Paper): 0149-645X
DOI: 10.1109/MWSYM.1992.187960
Regular:

The authors presents a systematic experimental examination of the validity of basic large-signal modeling assumptions by subjecting measured S-parameter data versus bias from MESFETs and HEMTs... View More

Advertisement