IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability analysis of sparse topologies for packet radio networks

Author(s): Hu, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Florence, Italy
Conference Date: 1 May 1992
ISBN (Paper): 0-7803-0602-3
DOI: 10.1109/INFCOM.1992.263488
Regular:

Four connectivity measures are used to compare the reliability of various sparse topologies for packet radio networks. Different scenarios, including link failures, node failures, and both types... View More

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