IEEE - Institute of Electrical and Electronics Engineers, Inc. - An efficient memory fault-test technique for ASIC-based memories

Author(s): Gorsche, S.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Chicago, IL, USA
Conference Date: 14 June 1992
ISBN (Paper): 0-7803-0599-X
DOI: 10.1109/ICC.1992.268274
Regular:

A new test technique that is efficient in terms of additional circuitry and test vectors and is easily implemented as a built-in-self test (BIST) circuit is described. The technique tests the... View More

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