IEEE - Institute of Electrical and Electronics Engineers, Inc. - SEE flight data from Japanese satellites

Author(s): T. Goka ; H. Matsumoto ; N. Nemoto
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1998
Volume: 45
Page Count: 8
Page(s): 2,771 - 2,778
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/23.736527
Regular:

This paper reviews the SEE (Single Event Effects) which have been observed on Japanese spacecraft in space since 1971, and summarizes the in-orbit SEL (Single Event Latch-up) and SEU (Single Event... View More

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