IEEE - Institute of Electrical and Electronics Engineers, Inc. - Frequency response of avalanche photodetectors with separate absorption and multiplication layers

Author(s): Weishu Wu ; A.R. Hawkins ; J.E. Bowers
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1996
Volume: 14
Page Count: 8
Page(s): 2,778 - 2,785
ISSN (Paper): 0733-8724
ISSN (Online): 1558-2213
DOI: 10.1109/50.545797
Regular:

We present analytical expressions for the frequency response of avalanche photodetectors (APDs) with separate absorption and multiplication regions (SAM). The effect of the electric field profile... View More

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