IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of bivariate mean residual-life function

Author(s): H.V. Kulkarni ; R.N. Rattihalli
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1996
Volume: 45
Page Count: 5
Page(s): 249 - 253
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.510810
Regular:

This paper gives a counter example to invalidate a claim of Nair and Nair (1989) regarding a characterization of bivariate mean residual-life function (BMRLF). The authors characterize BMRLF of an... View More

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