IEEE - Institute of Electrical and Electronics Engineers, Inc. - Process-related reliability-growth modeling-how and why

Author(s): Heimann, D.I. ; Clark, W.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 21 January 1992
Page(s): 316 - 321
ISBN (Paper): 0-7803-0521-3
DOI: 10.1109/ARMS.1992.187843
Regular:

A process-related nonhomogeneous Poisson process (PRNHPP) is developed. This is carried out by replacing the constant scale factor in the NHP by a process-age-dependent scale factor which... View More

Advertisement