IEEE - Institute of Electrical and Electronics Engineers, Inc. - Some critical remarks on a hierarchy of fault-detecting abilities of test methods [and reply]

Author(s): R.A. DeMillo ; A.P. Mathur ; W.E. Wong ; P.G. Frankl ; E.J. Weyuker
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1995
Volume: 21
Page Count: 6
Page(s): 858 - 863
ISSN (Paper): 0098-5589
DOI: 10.1109/32.469455
Regular:

In a recent article by P.G. Frankl and E.J. Weyuker (see ibid., vol.19, no.3, p.962-75, 1993), results are reported that appear to establish a hierarchy of software test methods based on their... View More

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