IEEE - Institute of Electrical and Electronics Engineers, Inc. - An empirical model of enhancement-induced defect activity in software

Author(s): D.L. Lanning ; T.M. Khoshgoftaar
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1995
Volume: 44
Page Count: 5
Page(s): 672 - 676
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.476000
Regular:

This study exploits the relationship between functional enhancement (FE) activity and defect distribution to produce a model for predicting FE induced defect activity. We achieve this in 2 steps:... View More

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