IEEE - Institute of Electrical and Electronics Engineers, Inc. - Joint reliability-importance of two edges in an undirected network

Author(s): Jung Sik Hong ; Chang Hoon Lie
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1993
Volume: 42
Page Count: 8
Page(s): 17 - 23
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.210266
Regular:

Joint reliability importance (JRI) of two edges in an undirected network is introduced. Concepts of joint failure importance (JFI) and marginal failure importance (MFI), duals of JRI and marginal... View More

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