IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of Electrical and Optical Loss MOCVD Regrown in Interfaces Layer lnGaAs-GaAs Quantum Well Heterostructure Lasers

Author(s): Coekerill, T.M. ; Honig, J. ; Alwan, J.J. ; Forbes, D.V. ; Coleman, J.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Cambridge, MA
Conference Date: 8 June 1992
Page(s): 115 - 116
ISBN (Paper): 0-87942-652-7
DOI: 10.1109/MOVPE.1992.664969
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