IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Tolerance for Alu - Evaluated Module Redundancy Technique

Author(s): Subharani, S. ; Palaniappan, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Singapore
Conference Date: 17 February 1992
Volume: 1
Page(s): 92 - 96
ISBN (Paper): 0-7803-0632-5
DOI: 10.1109/SICICI.1992.641653
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