IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sensitivity Robustness Tradeoff via the Generation of Optimal Residuals in the Parity Space

Author(s): Cassar, J.P. ; Djeghaba, M. ; Staroswiecki, M. ; Cocquempot, V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Singapore
Conference Date: 17 February 1992
Volume: 1
Page(s): 54 - 58
ISBN (Paper): 0-7803-0632-5
DOI: 10.1109/SICICI.1992.641646
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