IEEE - Institute of Electrical and Electronics Engineers, Inc. - Uncertainty Principles and Identification n-Widths for LTI and Slowly Varying Systems

1992 American Control Conference

Author(s): Lin Lin ; Le Yi Wang ; George Zames
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1992
Conference Location: Chicago, IL, USA, USA
Conference Date: 24 June 1992
Page(s): 296 - 300
ISBN (Paper): 0-7803-0210-9
DOI: 10.23919/ACC.1992.4792075
Regular:

In the identification of LTI systems, the optimal worst-case uncertainty depends on the observation time. This dependence is characterized via two notions of n-width, which are computed in the... View More

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