IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic test procedure generation from system specifications

Author(s): Lindsey, M.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Research Triangle Park, NC, USA
Conference Date: 23 June 1992
Page(s): 301 - 310
ISBN (Paper): 0-8186-3520-7
DOI: 10.1109/IWRSP.1992.243898
Regular:

Automated aids to generating test procedures for electronic systems from top-level system specifications are described. A five-phase design methodology which incorporates VHSIC description... View More

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