IEEE - Institute of Electrical and Electronics Engineers, Inc. - Security test and evaluation for multilevel-mode accreditation: Lessons learned

Author(s): Bodeau, D.J. ; Brusil, N.R. ; Chang, I.N. ; Reece, M.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: San Antonio, TX, USA
Conference Date: 30 November 1992
Page(s): 37 - 45
ISBN (Paper): 0-8186-3115-5
DOI: 10.1109/CSAC.1992.228235
Regular:

MITRE's experience and lessons learned in performing security test and evaluation (ST&E) for SPADOC 4B are described. ST&E drew on contractual testing but involved extensive government testing of... View More

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