IEEE - Institute of Electrical and Electronics Engineers, Inc. - A reliability analysis of failsoft FDDI networks

Author(s): Yin, J. ; Silio, C.B., Jr.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Minneapolis, MN, USA
Conference Date: 13 September 1992
Page(s): 158 - 167
ISBN (Paper): 0-8186-3095-7
DOI: 10.1109/LCN.1992.228162
Regular:

The reliability of three fiber distributed data interface (FDDI) network topologies is examined. The three interconnection topologies considered are a tree, a double ring, and a ring of trees. The... View More

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