IEEE - Institute of Electrical and Electronics Engineers, Inc. - Chamfer masks: discrete distance functions, geometrical properties and optimization

Author(s): Thiel, E. ; Montanvert, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: The Hague, Netherlands
Conference Date: 30 August 1992
Page(s): 244 - 247
ISBN (Paper): 0-8186-2920-7
DOI: 10.1109/ICPR.1992.201971
Regular:

The chamfer distances are based on the definition of masks whose size can change depending on the quality of the approximation which is expected, compared to the Euclidean distance. The authors... View More

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