IEEE - Institute of Electrical and Electronics Engineers, Inc. - A feature-based O(N/sup 2/) approach to point pattern matching

Author(s): Murtagh, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: The Hague, Netherlands
Conference Date: 30 August 1992
Page(s): 174 - 177
ISBN (Paper): 0-8186-2915-0
DOI: 10.1109/ICPR.1992.201748
Regular:

Describes an algorithm for the astronomical problem of matching star lists, given by their 2D coordinates against catalogue information. It is successful at determining mappings between two point... View More

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