IEEE - Institute of Electrical and Electronics Engineers, Inc. - SYSTEM TEST: WHAT IS IT? WHY BOTHER DEFINING IT?

Author(s): Smeyne, M.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Baltimore, MD, MD
Conference Date: 20 September 1995
ISBN (Paper): 0-7803-0760-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1992.527867
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