IEEE Computer Society - Using machine learning to understand manufacturing control issues

Proceedings Eighth Conference on Artificial Intelligence for Applications

Author(s): B.L. Whitehall ; B. Fulkerson ; J. Hall ; S.C.-Y. Lu
Sponsor(s): IEEE
Publisher: IEEE Computer Society
Publication Date: 1 January 1992
Conference Location: Monterey, CA, USA, USA
Conference Date: 2 March 1992
Page Count: 5
Page(s): 192 - 196
ISBN (Paper): 0-8186-2690-9
DOI: 10.1109/CAIA.1992.200029

The authors describe how machine learning can be used to help departmental supervisors to operate a factory as an integrated system. The feasibility of predicting potential problems on the shop... View More