IEEE - Institute of Electrical and Electronics Engineers, Inc. - Orthogonal built-in self-test

Author(s): Avra, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: San Francisco, CA, USA, USA
Conference Date: 24 February 1992
Page(s): 452 - 457
ISBN (Paper): 0-8186-2655-0
DOI: 10.1109/CMPCON.1992.186754
Regular:

The author introduces a new way to organize memory elements into scan chains for built-in self-testable data path logic. The goal of the procedure is to minimize the hardware overhead and... View More

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