IEEE - Institute of Electrical and Electronics Engineers, Inc. - An X-ray microtomography system for bone structure measurements

1992 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC'92)

Author(s): Flynn, M.J. ; Reimann, D.A. ; Parfitt, A.M. ; Fyhrie, D.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Orlando, FL, USA, USA
Conference Date: 25 October 1992
ISBN (Paper): 0-7803-0884-0
DOI: 10.1109/NSSMIC.1992.301514
Regular:

A system for very-high-resolution (50 mu m*50 mu m*50 mu m) three-dimensional tomography of small (1 cm*1 cm*1 cm) biological specimen is described. Two-dimensional planar X-ray views of... View More

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