IEEE - Institute of Electrical and Electronics Engineers, Inc. - Neural Network Parameter Estimation For A Bistatic Scattering Strength Model

Author(s): Bourgeois, B. ; Caruthers, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Newport, RI, USA, USA
Conference Date: 26 October 1992
Volume: 1
Page(s): 158 - 163
ISBN (Paper): 0-7803-0838-7
DOI: 10.1109/OCEANS.1992.612674
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