IEEE - Institute of Electrical and Electronics Engineers, Inc. - The utilization of positive ions for investigations of stray field effects in electrostatic lenses

Author(s): R. Azud ; W.F. Niklas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 1955
Volume: 2
Page(s): 25 - 27
ISSN (Paper): 0096-2430
DOI: 10.1109/T-ED.1955.14079
Regular:

The paper describes a method for the investigation of stray fields caused by surface charges on the glass supports of cathode-ray-tube guns. These stray fields may penetrate into the gap of an... View More

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