IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing of D-C Interrupters on A-C Test Circuits [includes discussion]

Author(s): K. Chen ; E. W. Boehne
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1955
Volume: 74
ISSN (Paper): 0097-2460
DOI: 10.1109/AIEEPAS.1955.4499194
Advertisement