IEEE - Institute of Electrical and Electronics Engineers, Inc. - Positive-Ion Trapping in Electron Beams

Author(s): E. L. Ginzton ; B. H. Wadia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1954
Volume: 42
Page(s): 1,548 - 1,554
ISSN (Paper): 0096-8390
DOI: 10.1109/JRPROC.1954.274761
Regular:

Residual gas within the envelope of an electron tube forms positive ions by electron collision. Ordinarily these ions are quickly lost to the cathode; however, if they can be held within the beam... View More

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