IEEE - Institute of Electrical and Electronics Engineers, Inc. - A statistical survey of atmospheric index-of-refraction variation

Author(s): C. Crain ; A. Straiton ; C. Von Rosenberg
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1953
Volume: 1
Page(s): 43 - 46
ISSN (Paper): 2168-0639
ISSN (Online): 2168-0647
DOI: 10.1109/T-AP.1953.27327
Regular:

This paper presents a statistical survey of index-of-refraction variations as recorded by an airborne microwave refractometer. Scales and intensities of the index variations are given, as well as... View More

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