IEEE - Institute of Electrical and Electronics Engineers, Inc. - N42.31-2003
American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 20 August 2003 |
| Status: | active |
| Page(s): | 1 - 40 |
| ICS Code (Radiation measurements): | 17.240 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
| ISBN (Electronic): | 978-0-7381-3799-5 |
| DOI: | 10.1109/IEEESTD.2003.94425 |
Standard:
Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluri
Document History
N42.31-2003
August 20, 2003
American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that...
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