IEEE - Institute of Electrical and Electronics Engineers, Inc. - 660-1986
IEEE Standard for Semiconductor Memory Test Pattern Language
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Inactive: Withdrawn
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 18 February 1986 |
| Status: | inactive |
| Page(s): | 1 - 14 |
| ISBN (Online): | 978-1-5044-0412-9 |
| DOI: | 10.1109/IEEESTD.1986.7434526 |
Regular:
The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify... View More
Document History
660-1986
February 18, 1986
IEEE Standard for Semiconductor Memory Test Pattern Language
The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the...
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