IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using integrated diagnostics on automatic test equipment

Author(s): Franco, J.R., Jr.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Anaheim, CA, USA, USA
Conference Date: 24 September 1991
Page(s): 337 - 343
ISBN (Paper): 0-87942-576-8
DOI: 10.1109/AUTEST.1991.197571
Regular:

The author addresses the use of integrated diagnostic tools and techniques as applied to automatic test equipment (ATE) and test program sets (TPSs). The use of the tools provided as part of the... View More

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