IEEE Computer Society - Test generation algorithm for incomplete scan design circuits with tri-state devices

Proceedings Pacific Rim International Symposium on Fault Tolerant Systems

Author(s): Zhi-gang Shi ; Zheng-hui Lin
Sponsor(s): Inst. Electron. Inf. Commun. Eng
Publisher: IEEE Computer Society
Publication Date: 1 January 1991
Conference Location: Kawasaki, Japan, Japan
Conference Date: 26 September 1991
Page Count: 6
Page(s): 206 - 211
ISBN (Paper): 0-8186-2275-X
DOI: 10.1109/RFTS.1991.212944

The paper describes a heuristic algorithm, DALG-EX18, for generating test patterns of incomplete scan design circuits with tri-state devices. The algorithm is based on the philosophy of the... View More