IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of Truncated Sequential Tests for Rapidly Fading Radar Targets

Author(s): Norval D. Wallace
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 1968
Volume: AES-4
Page(s): 433 - 442
ISSN (Paper): 0018-9251
DOI: 10.1109/TAES.1968.5408998
Regular:

Curves and equations are presented from which the exact performance of truncated sequential tests can be determined for one important case: the biased square-law detector for the detection of... View More

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