Recent Advances in X-Ray Detection Technology

Author(s): D. W. Aitken
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1968
Volume: 15
Page(s): 10 - 46
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1968.4324913



A review is presented of recent developments in x-ray photon detectors and in the associated detector electronics. The first portion of the paper is devoted to a survey of the presently available physical inforrnation on the "intrinsic" resolution of silicon and germanium radiation detectors, proportional counters and NaI(Tl) scintillation crystals. Semiconductor detectors suitable for x-ray applications and low noise electronics are then analyzed in some detail. Discussions follow on scintillation detectors, proportional counters, and "external" photoelectric detectors. Recent spectral achievements and interesting applications are illustrated.