IEEE - Institute of Electrical and Electronics Engineers, Inc. - The technical evolution of random-access cryoelectric memory systems

Author(s): R. Gange
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1968
Volume: 4
Page(s): 325
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/TMAG.1968.1066313
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