IEEE - Institute of Electrical and Electronics Engineers, Inc. - High reliability planar InGaAs avalanche photodiodes

Proceedings of IEEE International Electron Devices Meeting

Author(s): Kobayashi, M. ; Shirai, T. ; Kaneda, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1989
Conference Location: Washington, DC, USA, USA
Conference Date: 3 December 1989
Page(s): 729 - 732
ISBN (Paper): 0-7803-0817-4
ISSN (Paper): 0163-1918
DOI: 10.1109/IEDM.1989.74158
Regular:

The reliability of planar buried-structure InGaAs APDs (avalanche photodiodes) for long-wavelength optical transmission systems was investigated. High-temperature aging tests were performed at 150... View More

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