IEEE - Institute of Electrical and Electronics Engineers, Inc. - Circuit simulation of CMOS faults

Author(s): Koe, W.-Y. ; Midkiff, S.F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: Knoxville, TN, USA, USA
Conference Date: 10 April 1988
Page(s): 87 - 91
DOI: 10.1109/SECON.1988.194821
Regular:

The effect of short and open faults in CMOS circuits across a wide range of resistances using circuit, rather than logic, simulation is investigated. Circuit simulation is used to predict the... View More

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