IEEE - Institute of Electrical and Electronics Engineers, Inc. - A system-level reliability-growth model

Author(s): Robinson, D. ; Dietrich, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: Los Angeles, CA, USA, USA
Conference Date: 26 January 1988
Page(s): 243 - 247
DOI: 10.1109/ARMS.1988.196454
Regular:

Using a subsystem growth model developed by the authors together with the concepts associated with the composition of moments, the problem of system-level growth analysis is considered. It is... View More

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