IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spectral iterative techniques for the full-wave 3D analysis of (M)MIC structures

Author(s): Wertgen, W. ; Jansen, R.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: New York, NY, USA, USA
Conference Date: 25 May 1988
DOI: 10.1109/MWSYM.1988.22130
Regular:

As an alternative to conventional moment methods, spectral iterative techniques (SITs) are introduced for the full-wave 3-D analysis of microwave integrated circuit (MIC) and monolithic MIC (MMIC)... View More

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