IEEE - Institute of Electrical and Electronics Engineers, Inc. - SLOPE: a test pattern generator based on stop line oriented path end algorithm

Author(s): Chuang, S.-J. ; Lee, C.-L. ; Shen, W.-Z. ; Jen, C.-W. ; Chen, J.-E. ; Jing, S.-C. ; Chen, M.-D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: Espoo, Finland, Finland
Conference Date: 7 June 1988
DOI: 10.1109/ISCAS.1988.14958
Regular:

The authors present a test pattern generator, SLOPE, based on the stop line oriented path end algorithm, for combinational digital circuits. It combines the advantages of FAN and FAST by utilizing... View More

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