IEEE - Institute of Electrical and Electronics Engineers, Inc. - A reconfigurable VLSI array for reliability and yield enhancement

Author(s): Popli, S.P. ; Bayoumi, M.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: San Diego, CA, USA
Conference Date: 25 May 1988
Page(s): 631 - 642
ISBN (Paper): 0-8186-8860-2
DOI: 10.1109/ARRAYS.1988.18100
Regular:

The fault-tolerance scheme consists of two phases: testing and locating faults (fault diagnosis), and reconfiguration. The first phase uses an online error-detection technique that achieves a... View More

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