IEEE - Institute of Electrical and Electronics Engineers, Inc. - Morphological Feature Detection

Author(s): Noble, J.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: Tampa, FL
Conference Date: 5 December 1988
Page(s): 112 - 116
ISBN (Paper): 0-8186-0883-8
DOI: 10.1109/CCV.1988.589979
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