IEEE - Institute of Electrical and Electronics Engineers, Inc. - Adaptative backtrace and dynamic partitioning enhance ATPG (IC testing)

Author(s): Lioy, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: Rye Brook, NY, USA, USA
Conference Date: 3 October 1988
Page(s): 62 - 65
ISBN (Paper): 0-8186-0872-2
DOI: 10.1109/ICCD.1988.25660
Regular:

Two improvements to existing automatic-test-pattern-generation (ATPG) algorithms are proposed. First, an adaptive technique has been introduced to solve internal conflicts in the backtrace... View More

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