IEEE - Institute of Electrical and Electronics Engineers, Inc. - New automated prober support for high pincount test heads

Author(s): Fredriksen, T.R. ; Grano, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1988
Conference Location: Washington, DC, USA, USA
Conference Date: 12 September 1988
Page(s): 615 - 620
ISBN (Paper): 0-8186-0870-6
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1988.207844
Regular:

Automatic best-fit tip-to-pad alignment and skewed chip probing based on high-speed image processing is described. A complete solution is presented to automate and optimize the probe set up. It... View More

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